Keithley Instruments - Press Release 7-17-2007
KEITHLEY INTRODUCES LINUX-BASED PARAMETRIC TEST SYSTEMS
Ohio – June 17, 2007 -
Inc. (NYSE:KEI), a leader in solutions for emerging measurement
needs, announces a group of enhancements for its S600 Series
Parametric Test Systems. The main enhancement is a migration to
the Linux Operating System (OS) on the embedded control computer within
each test system. This provides a more stable OS and longer service
life for the computer, reducing the need for customers to qualify new
workstations and upgrade software and hardware resources. In addition,
firmware upgrades will provide throughput improvements compared to the
earlier UNIX-based systems. A new software licensing method incorporates
a hardware key for each tester in the form of a USB Stick, which can
be transferred from workstation to workstation for fast repair times.
For more information about Keithley’s Parametric Test Systems, visit
parametric test systems with Linux controllers join the growing list
of semiconductor equipment types that now utilize the Linux OS. With
its RF and parallel test options and appropriately designed test structures
and probe cards, the Model S680 is the only RF test system on the market
that can make simultaneous DC and RF measurements in parallel within
the same probe touchdown. This yields substantially higher throughput
than similar methods that perform sequential DC measurements followed
by RF measurements.
Compatibility. The Model
S680 system using the new Linux controller will be compatible on a mixed
system test floor. For customers who prefer a 100 percent Linux test
floor, field upgrades are available. In any case, a newly installed
Linux controller will operate seamlessly with existing parametric test
systems operating under Solaris. For example:
· Recipes – Format
and content are the same for those using Keithley Recipe Manager.
· User Library Source Code – The same source files are usable on
the new platform.
· KTXE – Both platforms use the same engine.
Those purchasing Keithley’s new S600 Series systems will get the
latest software version, KTE V5.2.2, which is also available as a field
upgrade. The new systems will have Red Hat Enterprise Linux WS Version
4, Update 4, and a new x86-based computer. Aside from the RF and parallel
test options, these systems can also be purchased with the adaptive
test option and 300mm wafer automation option. Because the GUI is similar
to that in earlier systems, minimal, if any, additional operator training
Price and Availability. For a customized
quote on a new system or field upgrades, contact the Keithley factory
for the specific configuration you have in mind. Upgrades and new systems
will be available for delivery starting September 2007.
Information For information on any of Keithley's test and measurement
systems, visit http://www.keithley.com
or contact the company at:
Telephone: 800-688-9951 440-248-0400
Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891
About Keithley. With
more than 60 years of measurement expertise, Keithley Instruments has
become a world leader in advanced electrical test instruments and systems
from DC to RF (radio frequency). Our products solve emerging measurement
needs in production testing, process monitoring, product development,
and research. Our customers are scientists and engineers in the worldwide
electronics industry involved with advanced materials research, semiconductor
device development and fabrication, and the production of end products
such as portable wireless devices. The value we provide them is a combination
of precision measurement technology and a rich understanding of their
applications to improve the quality of their products and reduce their
cost of test.
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