Keithley Instruments - Press Release 7-18-2007
KEITHLEY ANNOUNCES ADVANCED PARAMETRIC
Cleveland, Ohio – July 18, 2007 -
Inc. (NYSE:KEI), a leader in solutions for emerging measurement
needs, announced that it has qualified FormFactor, Inc., (Nasdaq:FORM),
Livermore, California, to manufacture high performance parametric test
probe cards for Keithley’s semiconductor parametric testers. FormFactor’s
probe cards will be used with Keithley S600 Series parametric testers
to measure very low-level DC currents as well as standard DC parametric
tests on pins that contact a semiconductor wafer. Wafer fabricators
and foundries employ S600 Series testers to qualify wafers for assembly
and packaging as well as process monitoring.
PROBE CARD AVAILABILITY
probe cards are well suited to applications involving Keithley's most
advanced parametric tester, the Model S680 DC/RF Parametric Test System.
The Model S680 is designed for wafer-level parametric testing of advanced
logic, memory, and analog ICs. In a single test system, it combines
parallel testing capability, high DC sensitivity, femtoamp-level resolution,
and RF s-parameter measurements up to 40GHz. This provides the industry's
highest throughput and a lower cost of ownership for measurements at
the 65nm node and beyond.
The Model S680 is ideal for sensitive,
high speed testing. Its signal preamplifiers, located in the test head,
boost low level signals within centimeters of the probe needles, then
transmit the boosted signals over cables to the measurement instruments
in the system cabinet. This approach eliminates the speed and sensitivity
losses that typically result from cable and switch matrix effects. External
instruments can be directly connected to the probe needles using the
eight general-purpose pathways.
Keithley considers FormFactor’s
technology to be a leading edge design for demanding, small pad size,
small pitch applications that must support high performance measurements
in ever-shrinking test structures and scribe lines.
of FormFactor demonstrates Keithley’s continuing drive to offer the
latest technologies for probe cards and parametric test metrology, and
to expand the number of probe card options available to our customers,”
said Mark Hoersten, Keithley’s vice president, business management.
“FormFactor probe cards represent a critical high performance technology
that meets the precision measurement challenges posed by the shrinking
components used in today’s electronic equipment.”
our Takumi parametric platform for Keithley testers is important for
the customers of both of our companies,” said Benjamin N. Eldridge,
FormFactor’s senior vice president – research & development and
chief technology officer. “Semiconductor manufacturers must rely on
test companies to provide the very latest measurement technologies as
they migrate to devices at the 65nm node and below, particularly as
part of a tightly integrated solution. Working closely with Keithley,
with its long history as an innovative leader in low level DC semiconductor
test, has allowed us to optimize our combined technologies.”
For More Information. For details on Keithley's Model S680 DC/RF parametric
http://www.keithley.com/products/semiconductor/?mn=S680, or contact
the company at:
Telephone: 800-688-9951 440-248-0400
Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891
For information on FormFactor products,
contact the company at:
Address: FormFactor Inc.
7005 Southfront Rd.
Livermore, CA 94551
With more than 60 years
of measurement expertise, Keithley Instruments has become a world leader
in advanced electrical test instruments and systems from DC to RF (radio
frequency). Our products solve emerging measurement needs in production
testing, process monitoring, product development, and research. Our
customers are scientists and engineers in the worldwide electronics
industry involved with advanced materials research, semiconductor device
development and fabrication, and the production of end products such
as portable wireless devices. The value we provide them is a combination
of precision measurement technology and a rich understanding of their
applications to improve the quality of their products and reduce their
cost of test.
in 1993, FormFactor, Inc. is the leader in advanced wafer probe cards,
which are used by semiconductor manufacturers to electrically test ICs.
The company’s wafer sort, burn-in and device performance testing products
move IC testing upstream from post-packaging to the wafer level, enabling
semiconductor manufacturers to lower their overall production costs,
improve yields, and bring next-generation devices to market. FormFactor
is headquartered in Livermore, California with operations in Europe,
Asia and North America.
company names listed are trademarks or trade names of their respective
RF Cafe began life in 1996 as "RF Tools" in an AOL screen name web space totaling
2 MB. Its primary purpose was to provide me with ready access to commonly needed
formulas and reference material while performing my work as an RF system and circuit
design engineer. The World Wide Web (Internet) was largely an unknown entity at
the time and bandwidth was a scarce commodity. Dial-up modems blazed along at 14.4 kbps
while tying up your telephone line, and a nice lady's voice announced "You've Got
Mail" when a new message arrived...
All trademarks, copyrights, patents, and other rights of ownership to images
and text used on the RF Cafe website are hereby acknowledged.
My Hobby Website: AirplanesAndRockets.com
| My Daughter's Website: EquineKingdom