Keithley Instruments - Press Release 10-9-2007
Keithley Makes C-V/I-V/Pulse Testing Faster, Simpler, and More Economical
With New Integrated C-V Module and Software in Market-Leading 4200-SCS
Ohio – October 9, 2007 -
Inc. (NYSE:KEI), a leader in solutions for emerging measurement
needs, announces a new C-V measurement instrument for its powerful Model
4200-SCS Semiconductor Characterization System. The Model 4200-CVU instrument
comes as a module that plugs into any available instrument slot of the
Model 4200-SCS, allowing fast and easy capacitance measurements from
femtoFarads (fF) to nanoFarads (nF), at frequencies from 10kHz to 10MHz.
Developed with the most modern and high performance circuitry available,
the Model 4200-CVU has eight patents pending on its innovative design.
This design provides intuitive point-and-click setup, simple cabling,
and built-in element models that eliminate the guesswork in obtaining
valid C-V measurements. Users of all experience levels can perform C-V
tests as if they were experts. Visit
for more information.
The Model 4200-CVU includes the most extensive
set of test libraries available, greatly increasing test efficiency.
Even more efficiency is possible with Keithley's Model 4200-LS-LC-12,
a special switch matrix and card with cables and adapters that enable
tightly integrated C-V/I-V testing with a single prober touchdown. The
optional Model 4200-PROBER-KIT allows easy connection of the Model 4200-SCS
to the most widely used probers. The net result is comprehensive C-V
testing that is as easy to set up and run as I-V tests.
Broad Application Support
With these latest
additions to its 4200-SCS line, Keithley has taken the lead in C-V instrumentation
and now satisfies the widest range of applications served by a single
semiconductor test instrument, covering a broad array of probers, device
types, process technologies, and measurement methodologies - including
pulse I-V. The Model 4200-CVU and optional modules solve the problems
of other characterization systems that either do not provide integrated
C-V/I-V/pulse, or have limited support in their user interfaces and
software libraries. Moreover, the system's flexible and powerful test
execution engine makes it simple to combine I-V, C-V, and pulsed tests
into the same test sequence. Therefore, the Model 4200-SCS can replace
a variety of electrical test tools with a single, tightly integrated
characterization solution. Nonetheless, Keithley's Model 4200-SCS will
continue to support C-V/I-V/pulse and other test methodologies utilizing
a variety of third party instruments. These characteristics make the
4200-SCS/CVU solution the ideal choice for:
- Semiconductor technology development/process development/reliability
- Materials and device research labs and consortia
- Any lab needing a benchtop DC or pulse instrument
- Most semi labs and users needing multi-use/multi-instruments
in a small form factor
The Model 4200-SCS has always
had the most intuitive Windows-based interface (GUI) of any semiconductor
characterization system on the market. Developed from many years of
customer interaction and feedback, this ease of use continues with the
new Model 4200-CVU hardware and software modules, which are a natural
extension of its interactive test environment and execution engine.
Keithley supports the Model 4200-CVU hardware with an extensive set
of sample programs, test libraries, and built-in parameter extraction
examples ready to run right out of the box. The eight software libraries
provide the broadest range of C-V test and analysis available. They
cover all the standard applications, including C-V, C-t, and C-f measurement
and analysis for high and low K structures, MOSFETs, BJTs, diodes, flash
memory, photovoltaic cells, III-V compound devices, and carbon nanotube
(CNT) devices. Besides junction, pin-to-pin, and interconnect capacitance,
the analysis and parameter extraction software yields doping profiles,
TOX, mobile ions, and carrier lifetime. These tests include various
linear and custom C-V sweeps, as well as C vs. time and C vs. frequency.
Unlike other characterization systems, the Keithley C-V/I-V
analysis and extraction programs operate in a well-documented open environment,
allowing users to easily make modifications and customize their routines.
Integrated sample projects, developed from the deep application knowledge
of Keithley engineers, help shorten program development time.
The Model 4200-CVU also comes with a variety of advanced diagnostic
tools to help ensure the validity of C-V test results. Uncertain if
a test result is accurate? Just click the on-screen "Confidence Check"
button, or use the real-time front panel to isolate portions of the
test setup for validation.
The well proven capabilities of the
Model 4200-SCS provide the best user experience with the shortest learning
curve. It solves the problems faced by semiconductor lab managers when
striving to increase productivity and efficiency in device characterization
Designed for Higher Throughput
Much of the credit for the Model 4200-CVU's exceptional measurement
accuracy, speed, and efficiency is due to the Model 4200-SCS's high
speed digital measurement hardware and tight hardware and software integration,
as well as Keithley's adherence to low-noise system design principles.
This combination of strengths means the Model 4200-CVU can improve users'
productivity significantly, whether the task is as simple as setting
up a single measurement or running a preset test sequence with a single
mouse-click, or as sophisticated as triggering and plotting multiple
C-V sweeps. The system's high speed digital architecture means the Model
4200-CVU can run and plot C-V sweeps in real time faster than any competitive
Highly Versatile Test Environment
In addition to I-V/C-V/pulse testing in one flexible, fully
integrated test environment, Model 4200-SCS users have several other
options. These include a choice of up to eight medium- or high-power
DC source-measure units (SMUs), dual-channel pulse and waveform generators,
and an integrated digital oscilloscope. Like the Model 4200-CVU, all
of these instruments plug into the Model 4200-SCS instrument slots and
are controlled by the powerful Keithley Test Environment Interactive
(KTEI, version 7.0) software environment. This point-and-click interface
streamlines test setup, test sequence control, and data analysis. KTEI
can also control a variety of external instruments, including most probers,
hot chucks, and test fixtures, as well as Keithley's high integrity
switch matrices, which provide the widest connection flexibility available
in the industry.
Many instrument manufacturers produce a continuous stream of products
that are not compatible with each other, and a new product often signals
the end of a previous offering - leaving no investment protection. Keithley's
policy of continual hardware and software upgrades to the Model 4200-SCS
means that the Model 4200-CVU module, along with all associated software
and optional hardware, can be retrofitted to the first Model 4200-SCS
ever built. This easy upgrade path eliminates the need to buy a new
parametric analyzer every few years to keep pace with innovations in
device or materials technology. Systems can be upgraded cost-effectively
to keep up with the industry's evolving test needs, so capital investments
in the Model 4200-SCS stretch much further than in competitive test
solutions. Furthermore, external hardware and test program development
is held to a minimum.
Price and Availability.
The Model 4200-CVU and optional kits will be available December 1, 2007.
Model 4200-CVU Module $13,000USD
KIT $ 7,270USD
Model 4200-PROBER-KIT $ 2,000USD
For a complete Model 4200-SCS with C-V/I-V/pulse capabilities, please
call the factory.
For More Information. For more information
about the Model 4200-CVU, visit
There you can also learn why the Model 4200-SCS is the most versatile
tool for all semiconductor labs needing DC, C-V, and pulse testing,
and get information on other Keithley semiconductor test solutions;
or you can contact the company at:
Telephone: 800-688-9951 440-248-0400
Address: Keithley Instruments, Inc.
Cleveland, OH 44139-1891
About Keithley Instruments,
With more than 60 years of measurement expertise,
Keithley Instruments has become a world leader in advanced electrical
test instruments and systems from DC to RF (radio frequency). Our products
solve emerging measurement needs in production testing, process monitoring,
product development, and research. Our customers are scientists and
engineers in the worldwide electronics industry involved with advanced
materials research, semiconductor device development and fabrication,
and the production of end products such as portable wireless devices.
The value we provide them is a combination of precision measurement
technology and a rich understanding of their applications to improve
the quality of their products and reduce their cost of test.
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