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Keithley Instruments Press Release 1-20-2009



Contact: Ellen Modock
Keithley Instruments, Inc.
  Keithley's Semiconductor Test Software Named One of 2008's Hottest Electronic Products by EDN Magazine   

Cleveland, Ohio - January 20, 2009 - Keithley Instruments, Inc. (NYSE:KEI), a leader in emerging measurement solutions, announces that its KTEI (Keithley Test Environment Interactive) V7.1 software for the Model 4200-SCS (Semiconductor Characterization System) has been named one of EDN magazine's Hot 100 Electronic Products of 2008. EDN's editors compile an annual list of the year's 100 most significant electronic products, including integrated circuits, components, computer boards, software tools, power devices, test instruments, and more. The editors select products they consider innovative and newsworthy, representing the best of the best of products and technologies announced during 2008.

KTEI V7.1 software incorporates a number of innovative features and functions that broaden the capabilities of Keithley's Model 4200-CVU (Capacitance-Voltage Unit), most notably software support for characterizing high-power semiconductor devices. This capability is useful for engineers working with automotive applications, display technology, microelectromechanical systems (MEMS), and other high-power applications. KTEI V7.1 also adds software support for other new functions, as well as a variety of software enhancements designed to speed and simplify testing.

Keithley's Model 4200-SCS is the most complete semiconductor characterization analyzer on the market, making tough measurements easy and lowering the cost of test by protecting capital equipment investment.  The system replaces a variety of electrical test tools with a single, tightly integrated characterization solution and is ideal for a wide range of applications, including semiconductor technology development, process development, and materials research in reliability labs, materials and device research labs, and consortia, as well as any lab needing a benchtop DC or pulse instrument. Keithley has continually enhanced the Model 4200-SCS's hardware and software since its introduction. This commitment to ongoing system innovation assures a cost-effective upgrade path, so users don't need to buy a new parametric analyzer because their current system is obsolete. Systems can be upgraded cost-effectively to keep pace with the industry's evolving test needs, stretching capital investments in the Model 4200-SCS even further.

For More Information. For more information on Keithley's KTEI V7.1, Model 4200-SCS Semiconductor Characterization System or any of its semiconductor test solutions, visit www.keithley.com/products/semiconductor/?mn=4200-SCS or conta
ct the company at:


FAX: 440-248-6168
E-mail: publisher@keithley.com
Internet: www.keithley.com
Address: Keithley Instruments, Inc.
  28775 Aurora Road
  Cleveland, OH 44139-1891

About Keithley Instruments, Inc.
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our products solve emerging measurement needs in production testing, process monitoring, product development, and research. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of precision measurement technology and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.

Products and company names listed are trademarks or trade names of their respective companies.


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