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 Keithley Makes C-V/I-V/Pulse
Testing Faster, Simpler, and More Economical With New Integrated C-V Module and Software in
Market-Leading 4200-SCS
Cleveland, Ohio – October 9, 2007 -
Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs,
announces a new C-V measurement instrument for its powerful Model 4200-SCS Semiconductor
Characterization System. The Model 4200-CVU instrument comes as a module that plugs into any
available instrument slot of the Model 4200-SCS, allowing fast and easy capacitance measurements
from femtoFarads (fF) to nanoFarads (nF), at frequencies from 10kHz to 10MHz. Developed with the
most modern and high performance circuitry available, the Model 4200-CVU has eight patents pending
on its innovative design. This design provides intuitive point-and-click setup, simple cabling, and
built-in element models that eliminate the guesswork in obtaining valid C-V measurements. Users of
all experience levels can perform C-V tests as if they were experts. Visit http://www.keithley.com/pr/078
for more information.
The Model 4200-CVU includes the most extensive set of test libraries available, greatly
increasing test efficiency. Even more efficiency is possible with Keithley's Model 4200-LS-LC-12, a
special switch matrix and card with cables and adapters that enable tightly integrated C-V/I-V
testing with a single prober touchdown. The optional Model 4200-PROBER-KIT allows easy connection of
the Model 4200-SCS to the most widely used probers. The net result is comprehensive C-V testing that
is as easy to set up and run as I-V tests.
Broad Application Support
With these latest additions to its 4200-SCS line, Keithley has taken the lead in C-V
instrumentation and now satisfies the widest range of applications served by a single semiconductor
test instrument, covering a broad array of probers, device types, process technologies, and
measurement methodologies - including pulse I-V. The Model 4200-CVU and optional modules solve the
problems of other characterization systems that either do not provide integrated C-V/I-V/pulse, or
have limited support in their user interfaces and software libraries. Moreover, the system's
flexible and powerful test execution engine makes it simple to combine I-V, C-V, and pulsed tests
into the same test sequence. Therefore, the Model 4200-SCS can replace a variety of electrical test
tools with a single, tightly integrated characterization solution. Nonetheless, Keithley's Model
4200-SCS will continue to support C-V/I-V/pulse and other test methodologies utilizing a variety of
third party instruments. These characteristics make the 4200-SCS/CVU solution the ideal choice for:
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Semiconductor technology development/process development/reliability labs
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Materials and device research labs and consortia
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Any lab needing a benchtop DC or pulse instrument
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Most semi labs and users needing multi-use/multi-instruments in a small form
factor
Powerful Software
The Model 4200-SCS has always had the most intuitive Windows-based interface (GUI) of any
semiconductor characterization system on the market. Developed from many years of customer
interaction and feedback, this ease of use continues with the new Model 4200-CVU hardware and
software modules, which are a natural extension of its interactive test environment and execution
engine. Keithley supports the Model 4200-CVU hardware with an extensive set of sample programs, test
libraries, and built-in parameter extraction examples ready to run right out of the box. The eight
software libraries provide the broadest range of C-V test and analysis available. They cover all the
standard applications, including C-V, C-t, and C-f measurement and analysis for high and low K
structures, MOSFETs, BJTs, diodes, flash memory, photovoltaic cells, III-V compound devices, and
carbon nanotube (CNT) devices. Besides junction, pin-to-pin, and interconnect capacitance, the
analysis and parameter extraction software yields doping profiles, TOX, mobile ions, and carrier
lifetime. These tests include various linear and custom C-V sweeps, as well as C vs. time and C vs.
frequency.
Unlike other characterization systems, the Keithley C-V/I-V analysis and extraction programs
operate in a well-documented open environment, allowing users to easily make modifications and
customize their routines. Integrated sample projects, developed from the deep application knowledge
of Keithley engineers, help shorten program development time.
The Model 4200-CVU also comes with a variety of advanced diagnostic tools to help ensure the
validity of C-V test results. Uncertain if a test result is accurate? Just click the on-screen
"Confidence Check" button, or use the real-time front panel to isolate portions of the test setup
for validation.
The well proven capabilities of the Model 4200-SCS provide the best user experience with the
shortest learning curve. It solves the problems faced by semiconductor lab managers when striving to
increase productivity and efficiency in device characterization and modeling.
Designed for Higher Throughput
Much of the credit for the Model 4200-CVU's exceptional measurement accuracy, speed, and
efficiency is due to the Model 4200-SCS's high speed digital measurement hardware and tight hardware
and software integration, as well as Keithley's adherence to low-noise system design principles.
This combination of strengths means the Model 4200-CVU can improve users' productivity
significantly, whether the task is as simple as setting up a single measurement or running a preset
test sequence with a single mouse-click, or as sophisticated as triggering and plotting multiple C-V
sweeps. The system's high speed digital architecture means the Model 4200-CVU can run and plot C-V
sweeps in real time faster than any competitive C-V meter.
Highly Versatile Test Environment
In addition to I-V/C-V/pulse testing in one flexible, fully integrated test environment, Model
4200-SCS users have several other options. These include a choice of up to eight medium- or
high-power DC source-measure units (SMUs), dual-channel pulse and waveform generators, and an
integrated digital oscilloscope. Like the Model 4200-CVU, all of these instruments plug into the
Model 4200-SCS instrument slots and are controlled by the powerful Keithley Test Environment
Interactive (KTEI, version 7.0) software environment. This point-and-click interface streamlines
test setup, test sequence control, and data analysis. KTEI can also control a variety of external
instruments, including most probers, hot chucks, and test fixtures, as well as Keithley's high
integrity switch matrices, which provide the widest connection flexibility available in the
industry.
Obsolescence Protection
Many instrument manufacturers produce a continuous stream of products that are not compatible
with each other, and a new product often signals the end of a previous offering - leaving no
investment protection. Keithley's policy of continual hardware and software upgrades to the Model
4200-SCS means that the Model 4200-CVU module, along with all associated software and optional
hardware, can be retrofitted to the first Model 4200-SCS ever built. This easy upgrade path
eliminates the need to buy a new parametric analyzer every few years to keep pace with innovations
in device or materials technology. Systems can be upgraded cost-effectively to keep up with the
industry's evolving test needs, so capital investments in the Model 4200-SCS stretch much further
than in competitive test solutions. Furthermore, external hardware and test program development is
held to a minimum.
Price and Availability. The Model 4200-CVU and optional kits will be available December 1,
2007. Pricing is:
Model 4200-CVU Module $13,000USD
Model 4200-LS-LC-12 KIT $ 7,270USD
Model 4200-PROBER-KIT $ 2,000USD
Model 4200-CVU-UPGRADE (hardware and software for existing 4200-SCS) $15,500USD
For a complete Model 4200-SCS with C-V/I-V/pulse capabilities, please call the factory.
For More Information. For more information about the Model 4200-CVU, visit http://www.keithley.com/pr/078.
There you can also learn why the Model 4200-SCS is the most versatile tool for all semiconductor
labs needing DC, C-V, and pulse testing, and get information on other Keithley semiconductor test
solutions; or you can contact the company at:
Telephone: 800-688-9951 440-248-0400
FAX: 440-248-6168
E-mail: publisher@keithley.com
Internet: www.keithley.com
Address: Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891
About Keithley Instruments, Inc.
With more than 60 years of measurement expertise, Keithley Instruments has
become a world leader in advanced electrical test instruments and systems from DC to RF (radio
frequency). Our products solve emerging measurement needs in production testing, process monitoring,
product development, and research. Our customers are scientists and engineers in the worldwide
electronics industry involved with advanced materials research, semiconductor device development and
fabrication, and the production of end products such as portable wireless devices. The value we
provide them is a combination of precision measurement technology and a rich understanding of their
applications to improve the quality of their products and reduce their cost of test.
Products and
company names listed are trademarks or trade
names of their respective companies.
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