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LeCroy Press Release - August 2, 2009
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LeCroy LeCroy Introduces WaveLink® 13 to 20 GHz High Bandwidth
Differential Solder-In Probes
Superior Rise Times with Low AC Loading and Probe Noise
 Chestnut
Ridge, NY, August 3, 2009 – LeCroy Corporation’s new line of WaveLink high bandwidth differential
solder-in probes provide superior rise time performance (20 ps for a 20 GHz probe used with a 20 GHz oscilloscope,
the same as the oscilloscope only rise time) with very low probe noise (25 nV/√Hz) and low AC loading at high
bandwidth (175Ω minimum). This combination of performance is essential for accurately characterizing next
generation of serial data signals, and comes closer in signal fidelity to cabled inputs than any other similar
bandwidth oscilloscope probe.
The new high bandwidth WaveLink probes, like the lower bandwidth WaveLink
probes, are of a transmission line design with an attenuating tip followed by an amplifier output to a
differential transmission line connecting to the oscilloscope with a platform/cable assembly. This type of design
was pioneered by LeCroy and provides superior performance at high bandwidth, and is now the standard type of
design for probes of bandwidth >6 GHz.
There are three models of Amplifier/Tip Modules – D1305 (13 GHz), D1605 (16 GHz) and D2005 (20 GHz). Each of these
models includes an amplifier for the rated bandwidth, two solder-in tips, 10 spare damping resistors, a variety of
clips and clamps to hold the solder-in tip or amplifier and prevent movement, and a protective storage case. In
addition, there are two models of Platform/Cable Assemblies – WL-PLINK-A and WL-2.92MM. Each of these models
includes a mounting clamp, a probe holder, a deskew fixture, a carrying case, and product documentation. The
WL-PLINK-A connects to the ProLink probe inputs which are used up to 16 GHz on all WaveMaster 8 Zi oscilloscopes
(and up to 18 GHz on the SDA18000 Serial Data Analyzers). The WL-2.92MM connects to the 2.92mm inputs on the
WaveMaster 820Zi (20 GHz), 825Zi (25 GHz), and 830 Zi (30 GHz) oscilloscopes. Thus, the probe architecture gives
the customer the flexibility to operate a single amplifier/tip module with either the ProLink (16 GHz) or 2.92mm
(up to 30 GHz) inputs on WaveMaster 8 Zi 20-30 GHz oscilloscopes. This is a significant advantage given that a
large percentage of the cost of a high bandwidth probe is in the amplifier/tip assembly.
Superior Probe Noise and Rise Time Performance
The new WaveLink probes incorporate an
advanced differential traveling wave (distributed) amplifier architecture to achieve superior high frequency
broadband performance. Traveling wave (distributed) amplifiers are commonly used in ultra high frequency broadband
amplifiers. This multi-stage amplifier architecture maximizes gain per stage and minimizes probe attenuation (only
2.5X), which provides very low 25 nV/√Hz probe noise (2.9 mVrms @ 13 GHz, 3.2 mVrms @ 16 GHz and 3.5 mVrms @ 20
GHz). This amplifier also provides ample bandwidth to provide superior rise times when the probe is used with a
WaveMaster 8 Zi Series oscilloscope of equivalent bandwidth. Therefore, the rise time specification of the probe
and oscilloscope combination is the same as that of the oscilloscope itself, making it possible to use an
oscilloscope probe for critical measurements without sacrificing the rise time (and hence bandwidth) performance
of the oscilloscope. This is especially important when
oscilloscope channels must be conserved for multiple
differential signal measurements, such as with multi-lane protocols like PCI Express.
Industry
Leading Minimum AC Loading
The minimum AC loading (Zmin) of the new WaveLink probe at high frequency is far superior to competitive units at
16 and 20 GHz, and roughly equivalent at 13 GHz. When a probe is connected to a 50Ω transmission line in a
circuit, some of the electrical signal in the circuit will conduct through the probe and some will remain within
the transmission line. If the probe impedance is higher, then less of the electrical signal will conduct through
the probe and, therefore, more will remain in the circuit – a desirable result. Conversely, lower probe impedance
has the opposite effect. Typically, manufacturers quote very high probe impedances at or very near DC, but high
frequency signals have insignificant frequency content in this range. Thus, what engineers find important is the
probe loading at very high frequencies (especially approaching the maximum probe frequency) where the probe is
designed and rated to measure. In this area, the WaveLink high bandwidth differential probes shine with a Zmin of
175Ω for 13, 16, and 20 GHz probes. This is roughly equivalent for 13 GHz probes, but far superior to what is
provided in competitive probes at 16 GHz (100Ω) or 20 GHz (not specified by competition, but presumably less than
100Ω). This enables the WaveLink probe to provide high signal fidelity and accurately reproduce the electrical
signal without also affecting the engineer’s circuit (and thus possibly affecting the measurement) by consuming
excessive current during the measurement).
Newly Re-Designed Solder-In Tip
Engineers have long appreciated the LeCroy solder-in tip for the placement of the damping resistors as near to the
circuit as possible, without long wire lengths (which affect probe performance) between the damping resistor and
the circuit. Not only did this provide excellent signal fidelity, but it also relieved the engineer of the burden
of precision measuring, cutting, and soldering of small pieces of wire to the end of the solder-in tip before use,
as is required with competitive solder-in probes. Now, LeCroy has improved on this design by making the damping
resistors on the solder-in tip field replaceable so that an engineer, faced with a damaged tip, can simply solder
a new damping resistor to the tip and quickly resume work. Each solder-in probe comes standard with 10 spare
damping resistors, and more can be ordered.
Further Information
Engineers and
technicians who would like to know more can contact LeCroy at 1-800-5LeCroy (1-800-553-2769) or visit the LeCroy
web site (www.lecroy.com).
Media contact: Patrick Brightman - SGW (973) 263-5475
Editors’ Technical contact: Ken Johnson – Product
Marketing Manager ken.johnson@lecroy.com
Customer contact: LeCroy Customer Care Center (800) 553-2769
Website:
www.lecroy.com
About LeCroy
LeCroy Corporation is a worldwide leader in serial data test solutions, creating
advanced instruments that drive product innovation by quickly measuring, analyzing, and verifying complex
electronic signals. The Company offers high-performance oscilloscopes, serial data analyzers, and global
communications protocol test solutions used by design engineers in the computer and semiconductor, data storage
device, automotive and industrial, and military and aerospace markets. LeCroy’s 45-year heritage of technical
innovation is the foundation for its recognized leadership in “WaveShape Analysis”—capturing, viewing, and
measuring the high-speed signals that drive today's information and communications technologies. LeCroy is
headquartered in Chestnut Ridge, New York. Company
information is available at
http://www.lecroy.com.
© 2009 by LeCroy Corporation. All rights reserved. Specifications are subject to change without notice.
Posted 8/12/2009
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