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Agilent Technologies Press Release - May 10, 2011
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Agilent Technologies Ships Latest IC-CAP Platform
for DC and RF Device Characterization and Modeling
-- Software Improves Modeling Flow with Link Between Measurement and Extraction
SANTA CLARA, Calif., May 10, 2011 – Agilent Technologies Inc. (NYSE: A) today announced shipment of the latest
release of its device modeling software platform,
Integrated Circuit Characterization and
Analysis Program. IC-CAP 2011.04 provides significant improvements in the modeling flow of semiconductor
devices by enabling the
IC-CAP Wafer Professional
automated measurement solution to link with IC-CAP’s CMOS model extraction packages.
Modern CMOS device modeling requires that a high volume of measurements be performed to analyze process trends and
identify data required for extraction of typical and corner-case device models. Managing and analyzing this data
to ensure the right choices are made for model extraction and verification is challenging. It often requires
modeling teams to use multiple software tools, converting data from one format to another, with loss of precision
and efficiency. IC-CAP WaferPro helps the user to collect and manage high volume data in the most efficient way.
Now, for the first time, the IC-CAP CMOS modeling packages work seamlessly with WaferPro.
With IC-CAP
2011.04, users are able to define devices and measurement tests in the Agilent CMOS Package environment and then
automatically create a WaferPro test plan that they can execute on a variety of test equipment. Once the devices
of various geometries have been characterized via WaferPro, the CMOS extraction module automatically reads the
measurement data for use in model extraction. This greatly improves the efficiency of the flow since there is no
need to transfer or reformat data between the measurement and modeling applications.
“Since its release
in 2010, IC-CAP WaferPro has become increasingly popular among customers due to its performance, flexibility, wide
support for test instruments and systems, and the way it helps maximize the utilization of lab equipment,” said
Roberto Tinti, product manager with Agilent’s EEsof EDA organization. “We are pleased to extend WaferPro’s
powerful capabilities to all the Agilent CMOS extraction package users. By doing so we are helping them make their
overall flow, from measurement to extraction, more efficient.”
In addition to the WaferPro and CMOS
packages link, IC-CAP 2011.04 adds support for Windows® 7 and several platform improvements in the areas of
simulation, measurements and programming environment. Enhancements include the ability to simulate with Verilog-A
and Agilent’s ADS simulator (included in the IC-CAP analysis module license at no extra cost), and support for
PARAM statements in spice netlists. Additionally, WaferPro now supports Tokyo Electron P8/P12 fully automated
probers, while Agilent’s B1505A DC power analyzer driver supports pulsed-bias on multiple-bias units.
About IC-CAP WaferPro and the CMOS Modeling Packages
Agilent’s W8510 IC-CAP WaferPro lets users perform automated on-wafer measurements at different temperatures by
controlling semiautomated and fully automated probe stations and advanced instruments such as the Agilent 4080
parametric testers. It is the most powerful measurement suite for DC-CV and RF device modeling measurements. The
IC-CAP CMOS measurement and extraction packages provide a dedicated software environment to extract typical and
corner-case models of advanced CMOS devices. Efficient parameter extraction procedures for CMOS industry-standard
models such as BSIM3, BSIM4, PSP, and HiSIM are fully supported. The packages provide the right balance between
the efficiency offered by a turnkey solution and the necessary customization capabilities to extract diverse
complex models of today’s CMOS devices.
About IC-CAP Software
Agilent IC-CAP software is a device modeling program that delivers powerful characterization and analysis
capabilities for today’s semiconductor modeling processes. Providing efficient and accurate extraction of active
device and circuit model parameters, IC-CAP performs numerous modeling tasks, including instrument control, data
acquisition, graphical analysis, simulation and optimization. It is used by semiconductor foundries and design
houses to characterize foundry processes.
More information on IC-CAP2011.04 is available at
www.agilent.com/find/eesof-iccap2011_04.
A high-resolution image of the IC-CAP WaferPro and CMOS model extraction packages for IC-CAP is available at
www.agilent.com/find/iccap2011_04_images.
About Agilent EEsof EDA Software
Agilent EEsof EDA is the leading
supplier of electronic design automation software for microwave, RF, high-frequency, high-speed digital, RF
system, electronic system level, circuit, 3-D electromagnetic, physical design and device-modeling applications.
More information is available at
www.agilent.com/find/eesof.
About Agilent Technologies
Agilent Technologies Inc. (NYSE: A) is the world’s premier measurement company
and a technology leader in chemical analysis, life sciences, electronics and communications. The company’s 18,500
employees serve customers in more than 100 countries. Agilent had net revenues of $5.4 billion in fiscal 2010.
Information about Agilent is available at
www.agilent.com.
Janet Smith, Americas
+1 970 679 5397
Twitter:
http://twitter.com/JSmithAgilent
PR Blog: http://janetsmithagilent.wordpress.com
janet_smith@agilent.com
Posted 5/11/2011
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