Agilent Technologies Advances X-Parameters* Innovations
SANTA CLARA, Calif., June 8, 2011 – Agilent Technologies Inc. (NYSE: A) today announced the latest wave of
X-parameter innovations designed to further advance their use and support the industry’s rapidly increasing interest
in the technology.
“X-parameters are a fast-moving technology, and we continue to invest heavily to advance
nonlinear measurements and characterization,” said Gregg Peters, vice president and general manager of Agilent’s
Component Test Division. “Within a short period of time, we have built up a solid base of industry-leading customers
and partners. This is an exciting area for us and is an example of our long-term belief that there is a unique
synergy between our instruments and our Agilent EEsof software products. ”
Agilent’s latest X-parameter
innovations include the following:
o Local fundamental frequency X-parameter measurements
simplify the X-parameter simulation of complex, multi-tone systems like super-heterodyne receivers, dramatically
reducing file size and memory usage while significantly improving simulation speed by approximately 10 to100 times.
o Breakthrough complex system, multi-tone X-parameter simulation performance. In situations
where accurate multi-tone simulations are required (e.g., analyzing spurious signals in a complex frequency
conversion system), a new adjustable model-reduction algorithm reduces the X-parameter file size and increases
simulation performance by approximately 10 to 100 times while maintaining model accuracy.
o
New Nonlinear Vector Network Analyzer (NVNA) X-parameter capabilities, including three-port mixer/converter,
multi-tone and pulsed X-parameters. These capabilities extend the applications for X-parameter measurements by
providing richer characterization of a device’s nonlinear behavior and capturing bandwidth dependencies.
o The powerful combination of the X-parameter model with the simulation and data-display
capabilities of Agilent’s Advanced Design System software enables engineers to investigate performance in much
richer ways than consulting an old-fashioned data sheet with a few graphs, tables and charts.
This announcement is timed in concert with the
International Microwave Symposium, being held this week in Baltimore, Md. Agilent’s X-parameter innovations will
be showcased in Booth 813, along with demonstrations of the NVNA, ADS 2011, Genesys and SystemVue solutions. In
addition, two MicroApp papers will be presented. Agilent’s Dr. Loren Betts will also serve as a panelist at the
Microwave Journal Nonlinear Characterization Expert MicroApp Forum.
For more information on X-parameters, go
to
www.agilent.com/find/x-parameters. More
information on Agilent’s X-parameter industry partnerships is available at
www.agilent.com/find/eesof-x-parameters.
About Agilent EEsof EDA Software
Agilent EEsof EDA is the leading supplier of electronic
design automation software for microwave, RF, high-frequency, high-speed digital, RF system, electronic system
level, circuit, 3-D electromagnetic, physical design and device-modeling applications. More information is
available at
www.agilent.com/find/eesof.
About Agilent Technologies
Agilent Technologies Inc. (NYSE: A) is the world’s premier
measurement company and a technology leader in chemical analysis, life sciences, electronics and communications.
The company’s 18,500 employees serve customers in more than 100 countries. Agilent had net revenues of $5.4
billion in fiscal 2010. Information about Agilent is available at
www.agilent.com.
Contact
Janet Smith, Americas
+1 970 679 5397
Twitter:
http://twitter.com/JSmithAgilent
PR Blog: http://janetsmithagilent.wordpress.com
janet_smith@agilent.com
Posted 6/14/2011
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