Copper Mountain Dielectric Property Measurements Webinar

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Dielectric properties are important for design of antenna and wireless technologies. As the internet of things, 5G, automotive sensing, and other advanced technologies become more prevalent, product designers and manufacturers require accurate material properties for ensuring their devices operate as desired. This webinar will provide information about dielectric materials measurements and introduces a new dielectric measurement method, called the "epsilometer." This method was developed to make dielectric property measurement accessible to the device designer. Not only was it designed with advanced computational electromagnetic design tools, but it was specifically engineered to make dielectric measurements both affordable and easy to do. This webinar will overview the new epsilometer method and give examples of how it can measure a variety of dielectric materials used to manufacture of wireless devices (e.g. substrates, radomes, etc.).

Additional Epsilometer Content

Principles of Operation Video
Description: John Schultz, Ph.D., of Compass Technology Group describes the principles of how the new Epsilometer operates.
Demo of the Epsilometer Video
Description: John Schultz, Ph.D., of Compass Technology Group describes how to use the new Epsilometer, a dielectric properties measurement device.
A New Dielectric Analyzer for Rapid Measurement of Microwave Substrates up to 6 GHz
Description: This paper from Compass Technology Group presents a new measurement method based on the parallel plate capacitor concept, which determines complex permittivity of dielectric sheets and films with thicknesses up to about 3 mm. Unlike the conventional devices, this new method uses a greatly simplified calibration procedure and is capable of measuring at frequencies from 10 MHz to 2 GHz, and in some cases up to 6 GHz. It solves the parasitic impedance limitations in conventional capacitor methods by explicitly modeling the fixture with a full-wave computational electromagnetic code. Specifically, a finite difference time domain (FDTD) code was used to not only design the fixture, but to create a database-based inversion algorithm. The inversion algorithm converts measured fixture reflection (S11) into dielectric properties of the specimen under test. This paper provides details of the fixture design and inversion method. Finally, example measurements are shown to demonstrate the utility of the method on typical microwave substrates.

Overview of dielectric materials measurement methods Introduction to technologies that enable improved material measurements Overview of the epsilometer, a new and more affordable way to obtain material dielectric properties

Copper Mountain Technologies develops innovative RF test and measurement solutions for engineers all over the world. The company's headquarters is in Indianapolis with sales offices in Singapore and Miami. The company pioneered metrology-grade USB VNAs in 2011 and continues to push for innovation and change in the industry to ensure engineers have access to the best technology. CMT achieved ISO 9001:2015 certification in 2019. The calibration lab in the USA is accredited in accordance with the recognized international standard ISO/IEC 17025 (2017) and meets all requirements of ANSI/NCSL Z540-1994-1. All CMT VNAs include application and automation support, and years of our engineering expertise at your disposal.

Copper Mountain Technologies provides a broad range of USB vector network analyzers, calibration kits, and accessories for 50 Ohm and 75 Ohm impedance. CMT VNAs are used for RF and Microwave applications from 9 kHz to 110 GHz by engineers in industries like defense, automotive, materials measurement, medical, broadcasting, and telecommunications.

Copper Mountain Technologies' VNAs include an RF measurement module and a software application which runs on any Windows PC, laptop or tablet, connecting to the measurement hardware via USB interface. The user can take advantage of the latest OS, processing power, larger display, and reliable performance of an external PC, as well as lower total cost of ownership and simplified maintenance of the analyzer. The result is a faster, more effective test process that fits into the modern workspace in lab, production, field and secure testing environments. This creative approach made Copper Mountain Technologies a leader in the industry and earned them both the 2015 Frost & Sullivan Global Leadership in Innovation Award and the 2017 Product Leadership Award.